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Single event upset
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#	Item
1	SINGLE EVENT EFFECTS ON COMMERCIAL SRAMS AND POWER MOSFETS: FINAL RESULTS OF THE CRUX FLIGHT EXPERIMENT ON APEX1 Janet L. Barth NASA/Goddard Space Flight Center Add to Reading List Source URL: radhome.gsfc.nasa.gov Language: English - Date: 2009-05-20 19:52:42 Digital electronics Single event upset Proton MOSFET EDI Solar particle event
2	The Need for Harsh Environment Electronic Systems in the UK Aerospace System Pillar Rolls-Royce Controls and Data Services Limited Steve Dennison Chief of Component Strategy Greg Wells Add to Reading List Source URL: www.aerodays2015.com Language: English - Date: 2015-11-04 05:31:59 Single event upset Electronics Circuit design
3	The Need for Harsh Environment Electronic Systems in the UK Aerospace System Pillar Rolls-Royce Controls and Data Services Limited Steve Dennison Chief of Component Strategy Greg Wells Add to Reading List Source URL: www.aerodays2015.com Language: English Single event upset Electronics Circuit design
4	Application Note Physical 3D Single Event Upset Simulation of a SRAM Cell with VICTORY and SmartSpice SEE Introduction Add to Reading List Source URL: www.silvaco.com Language: English - Date: 2015-06-02 20:30:26
5	ISS SPACE RADIATION EFFECTS AND EXPERIENCE: UTILIZATION FOR CURRENT AND FUTURE EXPLORATION PROGRAMS Bill Atwell - Boeing Research & Technology, Houston ,TX Steve Koontz - NASA, Johnson Space Center, Houston, TX Eugene No Add to Reading List Source URL: wrmiss.org Language: English - Date: 2013-05-03 03:03:38 Radioactivity Digital electronics Radiation Nuclear physics Cosmic ray Ionizing radiation Single event upset Soft error Health threat from cosmic rays Physics Medicine Radiobiology
6	PhD Scholarship at Australian Centre for Space Engineering Research Required Background: Keywords: Preferred Experience: Application Deadline: Supervisors: Add to Reading List Source URL: www.garada.unsw.edu.au Language: English - Date: 2011-12-03 00:47:20 Electronics Field-programmable gate array Single event upset MBus SBus Application-specific integrated circuit Electronic engineering Computer buses Computer hardware
7	1 Guide to the 2006 IEEE Radiation Effects Data Workshop Record David M. Hiemstra, Senior Member, IEEE Add to Reading List Source URL: www.nsrec.com Language: English - Date: 2007-12-18 18:45:37 Semiconductor devices Fabless semiconductor companies Optoelectronics Electrical components Integrated circuits Diode Opto-isolator Field-programmable gate array Single event upset Electronics Electronic engineering Electromagnetism
8	I-2 1 Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Add to Reading List Source URL: lws-set.gsfc.nasa.gov Language: English - Date: 2010-08-30 09:10:03 Digital electronics Software testing Fault injection Field-programmable gate array Single event upset LEON Fault-tolerant system Xilinx Reconfigurable computing Electronic engineering Computer hardware Electronics
9	Breakout Session Summary: Correlative Environments Chair: Paul O’Brien (The Aerospace Corporation) Co-chair: Pat O’Neill (NASA/JSC) Add to Reading List Source URL: lws-set.gsfc.nasa.gov Language: English - Date: 2010-06-17 10:21:03 Cosmic rays Radioactivity Human spaceflight Radiation effects Radiobiology Health threat from cosmic rays Ionizing radiation Radiation hardening Single event upset Physics Radiation Electronics
10	Practical Problems in Spacecraft Design Add to Reading List Source URL: www.nsrec.com Language: English - Date: 2015-01-22 00:57:48 Human spaceflight Radiobiology Ionizing radiation Radioactivity Health threat from cosmic rays Single event upset Radiation Spacecraft design Van Allen radiation belt Physics Spaceflight Technology

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